D. H. Do, D. Nguyen, and T. H. D. Phan, “Improving the DF-Louvain Algorithm through Random Walk-Based Refinement,” in Proc. 2025 RIVF International Conference on Computing and Communication Technologies (RIVF), Ho Chi Minh City, Vietnam, 2025.
V. D. Nguyen, K. Khaldi, D. Nguyen, P. Mantini, and S. Shah, “Contrastive viewpoint-aware shape learning for long-term person re-identification,” in Proc. IEEE/CVF Winter Conf. on Applications of Computer Vision (WACV), 2024, pp. 1030–1038, doi: 10.1109/WACV57701.2024.00108.
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA, USA
Talk at London School of Testing, London, UK
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley, CA, USA
Talk at UC San Francisco, Department of Testing, San Francisco, CA, USA